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Page 1: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based
Page 2: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 1 of 30

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LABORATORY LOCATION: (PERMANENT LABORATORY)

METCAL TECHNOLOGIES (M) SDN. BHD. NO. 36, CANGKAT BUKIT BELAH 11920 BAYAN LEPAS PULAU PINANG MALAYSIA

FIELDS OF CALIBRATION: DIMENSIONAL, MASS, FORCE, TORQUE, TEMPERATURE, PRESSURE, VOLUME, ELECRTRICAL, TIME AND FREQUENCY

This laboratory has demonstrated its technical competence to operate in accordance with MS ISO/IEC 17025:2017 (ISO/IEC 17025:2017). This laboratory’s fulfillment of the requirements of ISO/IEC 17025 means the laboratory meets both the technical competence requirements and management system requirements that are necessary for it to consistently deliver technically valid test results and calibrations. The management system requirements in ISO/IEC 17025 are written in language relevant to laboratory operations and operate generally in accordance with the principles of ISO 9001 (see Joint ISO-ILAC-IAF Communiqué dated April 2017). * The expanded uncertainties are based on an estimated confidence probability of approximately 95% and have a coverage factor of k=2 unless stated otherwise.

SCOPE OF CALIBRATION: DIMENSIONAL

SITE: CATEGORY I

Instrument Calibrated/

Measurement Parameter

Calibration and Measurement

Capability Expressed as an Uncertainty(±)*

Range Remarks

Coordinate Measuring Machine

X-axis : 0 to 1500 mm Y-axis : 0 to 1500 mm Z-axis : 0 to 1500 mm

Diagonal : 0 to 1500 mm

(0.4 + 13 L) µm

‘L’ in metre

Long Gauge Block, Ball Bar based on ISO 10360-2:2010 and 10360-5:2010

Profile Projector X, Y-axis: 3 µm Comparison with

(Measuring Accuracy 0 to 300 mm standard scale

of Individual Axis) based on

JIS B 7184:1999

Measuring Scope X, Y-axis: 2 µm Comparison with

(Measuring Accuracy 0 to 300 mm standard scale

of Individual Axis) based on

JIS 7153:1995

Surface Plate 600 x 600 mm 1.3 µm Planekator,

1200 x 1200 mm 1.5 µm micro-indicator

1800 x 1800 mm 1.7 µm based on

JIS B 7513:1992

Page 3: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 2 of 30

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SCOPE OF CALIBRATION: DIMENSIONAL

SITE: CATEGORY I

Signatories:

1. Kenny Ching Ah Hoo ( except CMM ) 2. Eunice Wong Phaik Gaik ( except CMM ) 3. Ching Kar Chien 4. Chew Siou Lian ( except CMM )

Instrument Calibrated /

Measurement Parameter

Range

Calibration and Measurement

Capability Expressed as an Uncertainty(±)*

Remarks

Vernier, Dial & Digital Height Gauge / Linear Height

0 mm to 600 mm

(1.3 + 4.7L) µm

‘L’ in metre

Comparison with gauge blocks,

length comparator height master

riser blocks based on

JIS B 7517:2018

Page 4: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 3 of 30

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SCOPE OF CALIBRATION: DIMENSIONAL

Signatories:

1. Kenny Ching Ah Hoo 2. Eunice Wong Phaik Gaik 3. Ching Kar Chien 4. Chew Siou Lian

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement

Capability Expressed as an Uncertainty(±)*

Remarks

Gauge Block 0.5 mm to 100 mm (0.11 + 3L) µm

‘L’ in metre

Comparison with master gauge block based on ISO 3650 /

JIS B 7506:2004

High Accuracy 0 mm to 25 mm 0.4 µm Comparison with gauge block

based on JIS B 7502:2016

Micrometer (0.0001 mm res.)

External Micrometer 0 mm to 25 mm 0.8 µm

25 mm to 100 mm 0.8 µm

100 mm to 250 mm 2.3 µm

250 mm to 500 mm

4.7 µm

Vernier, Dial & Digital 0 mm to 600 mm (6.4 + 3.4L) µm Comparison with

Caliper caliper checker /

‘L’ in metre gauge block based

on JIS B 7507:2016

Dial Gauge / 0 mm to 50 mm 1.7 µm Comparison with

Digital Indicator gauge tester based

on JIS B 7503:2017

Dial Test Indicator 0 mm to 1.6 mm 1.6 µm Comparison with

gauge tester based

on JIS B 7533:2015

Vernier, Dial & Digital Height Gauge

0 mm to 100 mm 100 mm to 600 mm

(0.6 + 2.8L) µm (9.3L) µm

‘L’ in metre

Comparison with caliper checker /

gauge block based on JIS B 7517:2018

Dial & Digital Thickness Gauge

0 to 20 mm 2.5 µm Comparison with gauge block based on JIS B 7503:2017

Plain Pin Gauge (diameter only)

0.10 mm to 25 mm 0.58 µm Direct measurement with micrometer based on

JIS B 7420:1997

Feeler Gauge 0.01 mm to 3 mm 0.78 µm Direct measurement with micrometer based

on JIS B 7524:2008

Depth Micrometer/Gauge

0 mm to 300 mm 6 µm Comparison with gauge block based on JIS B 7544:1994 /

JIS B 7518:1993

Page 5: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 4 of 30

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SCOPE OF CALIBRATION: DIMENSIONAL

Signatories:

1. Ching Kar Chien 2. Chew Siou Lian

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Plain Ring Gauge 20 mm to 100 mm (0.4 µm + 12L) µm Length

Comparator

‘L’ in metre JIS B 7420:1997

Glass Scale 0 mm to 200 mm 6.2 µm Measuring

System and

Reference

Scale on

JIS B 7541:2001

Steel Ruler 0 mm to 300 mm 0.068 mm Measuring

Projector

JIS B 7516:2005

Angle Protractor 0 Degree to 60 Degree 0.13 Degree Sine Bar, Slip

Gauges,

Comparator

VDI/WDE/DGQ

2618

Page 6: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 5 of 30

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SCOPE OF CALIBRATION: DIMENSIONAL

Instrument Calibrated/ Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Height Master Up to 300 mm 2.3 µm Comparison with

gauge block

based on

AS 3779:1990

Riser Block Up to 300 mm 2.3 µm Comparison with

gauge block

based on

AS 3779:1990

Electrical Comparator ± 5 µm 0.10 µm Comparison with

(Mu-checker) ± 15 µm 0.16 µm gauge block

± 50 µm 0.31 µm based on

± 150 µm 1.2 µm JIS B 7536:1982

± 500 µm 2.9 µm

± 1500 µm 12 µm

Parallel Thread Plug Major diameter 0.6 µm Three wire

Gauge 1 mm to 25 mm method

based on

Pitch diameter 1.7 µm JIS B 0261:2004

0.25 mm to 6 mm

Pitch 3.4 µm

0.25mm to 3 mm

Signatories:

1. Eunice Wong Phaik Gaik (Except for Scope Parallel Thread Plug Gauge) 2. Ching Kar Chien 3. Chew Siou Lian

Page 7: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 6 of 30

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SCOPE OF CALIBRATION: MASS SITE: CATEGORY I

Instrument Calibrated/ Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Weighing Balance Up to 50 g 0.039 mg Standard weight based on

ASTM E898-88:2013

(Analytical Balance, Up to 250 g 0.27 mg

Scale, Electronic type, Up to 5000 g 0.019 g

platform or pallet) Up to 10 kg 0.65 g

Up to 20 kg 2.6 g

Up to 150 kg 0.049 kg

Up to 300 kg 0.067 kg

Up to 500 kg 0.12 kg

Up to 1000 kg 0.45 kg

Up to 3000 kg 1.6 kg

Standard Weight 1 kg 2 kg 5 kg 10 kg 20 kg

13 mg 19 mg 40 mg 77 mg 0.16 g

Direct Comparison using the ABBA or

AB1…. BnA weighing sequence

Signatories:

1. Kenny Ching Ah Hoo ( except Standard Weight ) 2. Eunice Wong Phaik Gaik ( except Standard Weight ) 3. Ching Kar Chien 4. Chew Chii Tsong

Page 8: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 7 of 30

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SCOPE OF CALIBRATION: MASS

Instrument Calibrated/ Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Standard Weights 1 mg 0.009 mg Direct Comparison

using the ABBA or AB1 …BnA

weighing sequence.

2 mg 0.009 mg

5 mg 0.009 mg

10 mg 0.009 mg

20 mg 0.010 mg

50 mg 0.010 mg

100 mg 0.010 mg

200 mg 0.011 mg

500 mg 0.011 mg

1 g 0.012 mg

2 g 0.013 mg

5 g 0.015 mg

10 g 0.018 mg

20 g 0.018 mg

50 g 0.046 mg

100 g 0.12 mg

200 g 0.14 mg

500 g 0.89 mg

1 kg 0.96 mg

2 kg 1.5 mg

5 kg 4.7 mg

10 kg 0.012 g

20 kg 0.018 g

50 kg 9.3 g

Signatories:

1. Ching Kar Chien 2. Chew Siou Lian

Page 9: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 8 of 30

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SCOPE OF CALIBRATION: FORCE

SITE: CATEGORY I

Instrument Calibrated/ Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Hardness Testing Machine (HRC)

30 to 60 HRC 0.25 HRC Standard hardness block

Force Indicating Device (Tension)

0 N to 10 N 10 N to 50 N 50 N to 100 N

0.0013 N 0.013N 0.13 N

Dead Weights

method based on ISO 7500-1:2018

Force Indicating Device (Compression)

0 N to 10 N 10 N to 50 N 50 N to 100 N

100 N to 500 N

0.0013 N 0.013 N 0.13 N 1.3 N

Signatories:

1. Kenny Ching Ah Hoo (except Force Indicating Device) 2. Eunice Wong Phaik Gaik (except Force Indicating Device) 3. Ching Kar Chien 4. Chew Chii Tsong (except Hardness Testing Machine)

SCOPE OF CALIBRATION: FORCE

Instrument Calibrated/ Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Durometer Hardness Spring force for 0.65 durometer point Durometer Calibrator

ASTM D 2240:2015

Type A, B & O

Type C, D & DO

Force Gauge / Push- Pull Gauge

0 N to 10 N 10 N to 50 N 50 N to 500 N

500 N to 1000 N

± 0.0011 N ± 0.011 N ± 0.080 N ± 0.80 N

Dead weights method

ISO 7500-1:2018

Signatories:

1. Kenny Ching Ah Hoo (except Durometer Hardness) 2. Eunice Wong Phaik Gaik (except Durometer Hardness) 3. Ching Kar Chien 4. Chew Chii Tsong (except Durometer Hardness)

Page 10: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 9 of 30

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SCOPE OF CALIBRATION: PRESSURE

SITE: CATEGORY I

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement

Capability Expressed as an Uncertainty(±)*

Remarks

Pressure Indicating

Devices (Pressure

Gauge, Vacuum

Gauge, Manometer,

Magnehelic)

Manometer -5.8 to 5.8 psi 0.00078 psi Comparison

with Reference

Vacuum -12 to 0 psi 0.022 psi Pressure

Calibrator

Pneumatic/Hydraulic 0 to 300 psi 0.049 psi

Hydraulic 300 to 10000 psi 4.8 psi

Signatories:

1. Ching Kar Chien 2. Chew Siou Lian 3. Chew Chii Tsong

SCOPE OF CALIBRATION: PRESSURE

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement

Capability Expressed as an Uncertainty(±)*

Remarks

Pressure Indicating

Devices (Pressure

Gauge, Vacuum

Gauge, Manometer,

Magnehelic)

Manometer -5.8 to 5.8 psi 0.00078 psi Comparison

with Reference

Vacuum -12 to 0 psi 0.022 psi Pressure

Calibrator

Pneumatic/Hydraulic 0 to 300 psi 0.049 psi

Hydraulic 300 to 10000 psi 4.8 psi

Signatories:

1. Ching Kar Chien 2. Chew Siou Lian 3. Chew Chii Tsong

Page 11: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 10 of 30

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SCOPE OF CALIBRATION: TORQUE

SITE: CATEGORY I

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Torque Tools (Torque Wrench,

Torque Driver Fixed or Adjustable)

0 N.m to 1 N.m 0.0055 N.m Based on ISO 6789-1:2017

Above 1 N.m to 5 N.m 0.048 N.m

Signatories:

1. Ching Kar Chien 2. Chew Chii Tsong

SCOPE OF CALIBRATION: TORQUE

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Torque Measuring Devices

0 N.m to 1 N.m Above 1 N.m to 10 N.m

Above 10 N.m to 40 N.m Above 40 N.m to 300 N.m

Above 300 N.m to 1000 N.m Above 1000 N.m to 1500 N.m

0.012 N.m 0.020 N.M 0.042 N.M 0.34 N.m 1.1 N.m 2.4 N.m

Calibration using dead weights and known radius of torque wheel / double-ended

calibration beam

Torque Tools (Torque

Wrench, Torque Driver, Fixed or

Adjustable)

Up to 1 N.m Above 1 N.m to 5 N.m Above 5 N.m to 10 N.m

Above 10 N.m to 40 N.m Above 40 N.m to 150 N.m Above 150 N.m to 600 N.m

Above 600 N.m to 1000 N.m Above 1000 N.m to 1500 N.m

0.0055 N.m 0.048 N.m 0.054 N.m 0.18 N.m 0.48 N.m 1.4 N.m 1.8 N.m 2.7 N.m

Based on ISO 6789-1:2017

Signatories:

1. Kenny Ching Ah Hoo (except Torque Tools) 2. Eunice Wong Phaik Gaik (except Torque Tools) 3. Ching Kar Chien 4. Chew Chii Tsong (except Torque Measuring Devices) 5. Chew Siou Lian (except Torque Measuring Devices)

Page 12: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 11 of 30

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SCOPE OF CALIBRATION: TEMPERATURE SITE: CATEGORY I

Signatories:

1. Ching Kar Chien 2. Chew Siou Lian 3. Chew Chii Tsong

4. Nor Faeizah Binti Azmi (Temperature Sensor only)

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Temperature Enclosure

-95 °C to -40 °C Above -40 °C to 200 °C

Above 200 °C to 500 °C

0.83 °C 0.23 °C 0.58 °C

Using temperature sensor / logger

based on DKD-R 5-7 /

AS 2853-1986

Humidity 10 % RH to 98 % RH 2.5 % RH Using Dry bulb &

Enclosure Wet bulb

10 °C to 95 °C 0.58 °C sensor / logger

based on

JTM K01-1991

Temperature -90 °C to -80 °C 0.090 °C Comparison with

Sensor Above -80 °C to -40 °C 0.072 °C PT 100 in Metrology

Above -40 °C to 100 °C 0.043 °C Well / Liquid Bath /

Above 100 °C to 300 °C 0.12 °C Temperature

Above 300 °C to 500 °C 0.51 °C Block Calibrator

Page 13: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 12 of 30

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SCOPE OF CALIBRATION: TEMPERATURE

SITE: CATEGORY I

Signatories:

1. Ching Kar Chien 2. Chew Chii Tsong

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Temperature

Simulator

K -100 ˚C to 1300 ˚C 0.19 ˚C Measurement using

Temperature Calibrator

J -100 ˚C to 1200 ˚C 0.16 ˚C

T -100 ˚C to 400 ˚C 0.18 ˚C

E -100 ˚C to 950 ˚C 0.13 ˚C

N -200 ˚C to 1300 ˚C 0.25 ˚C

B 600 to 1800 ˚C 0.93 ˚C

R 0 to 1700 ˚C 0.64 ˚C

S 0 to 1700 ˚C 0.60 ˚C

Pt 100 -100 to 800 ˚C 0.059 ˚C

Temperature Indicator

Electrical simulation using

Temperature Calibrator based

on EURAMET/cg-

11/v.01

K -100 to 1300 ˚C 0.14 ˚C

J -100 to 1200 ˚C 0.12 ˚C

T -100 to 400 ˚C 0.12 ˚C

E -100 to 950 ˚C 0.10 ˚C

N -200 ˚C to 1300 ˚C 0.16 ˚C

B 600 to 1800 ˚C 0.50 ˚C

R 0 to 1700 ˚C 0.35 ˚C

S 0 to 1700 ˚C 0.33 ˚C

Pt 100 -100 to 800 ˚C 0.065 ˚C

Page 14: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 13 of 30

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SCOPE OF CALIBRATION: TEMPERATURE

Signatories:

1. Ching Kar Chien 2. Chew Chii Tsong 3. Nor Faeizah Binti Azmi (Temperature Sensor only)

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Temperature Sensor -90 ˚C to -40 ˚C Above -40 ˚C to 100 ˚C Above 100 ˚C to 300 ˚C Above 300 ˚C to 500 ˚C

0.050 ˚C 0.032 ˚C 0.10 ˚C 0.51 ˚C

Comparison with PT 100 / Type K-

Sensor in Metrology Well /

Liquid Bath / Temperature

Block Calibrator

Surface Sensor 0 ˚C to 50 ˚C 0.50 ˚C Comparison with

50 ˚C to 200 ˚C 0.55 ˚C reference

200 ˚C to 300 ˚C 0.71 ˚C surface sensor

on electronic

hotplate /

equalizing block

of dry bath

Temperature Block

Calibrator

-20 ˚C to 300 ˚C 300 ˚C to 600 ˚C 600 ˚C to 700 ˚C

0.061 ˚C 0.12 ˚C 1.0 ˚C

Comparison with PT 100 /

Thermocouple Type-K

EURAMET cg-13 Version 3.0

Radiation / Infrared Thermometer

-30 ˚C to 0 ˚C Above 0 ˚C to 100 ˚C

Above 100 ˚C to 200 ˚C Above 200 ˚C to 300 ˚C Above 300 ˚C to 400 ˚C Above 400 ˚C to 500 ˚C Above 500 ˚C to 650 ˚C

0.72 ˚C 0.44 ˚C 0.78 ˚C 1.2 ˚C 1.7 ˚C 2.1 ˚C 2.7 ˚C

Comparison with PT100 and Type K

In Blackbody Source ASTM E 2847:2014

Page 15: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 14 of 30

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SCOPE OF CALIBRATION: TEMPERATURE

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement

Capability Expressed as an Uncertainty(±)*

Remarks

Themohygro Devices

A) Relative Humidity 20 %rh to 80 %rh 1.8 %rh Comparison with

80 %rh to 90 %rh 2.2 %rh Reference Standard

in

Temperature 0 °C to 60 °C 0.10 °C Temperature/Humidity

Chamber

B) Relative Humidity 11 %rh 1.1 %rh Fixed Point

(Fixed Point) 33 %rh 1.3 %rh Calibration in Salt

75 %rh 1.4 %rh Chamber

97 %rh 1.7 %rh

Temperature 25 °C 0.31 °C

Liquid – In – Glass 0 °C to 200 °C 0.10 °C Comparison with

Thermometer PT100 in a stirred

(Total Immersion) liquid bath

Signatories:

1. Ching Kar Chien 2. Chew Siou Lian 3. Chew Chii Tsong

Page 16: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 15 of 30

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SCOPE OF CALIBRATION: TEMPERATURE

Signatories:

1. Ching Kar Chien 2. Chew Chii Tsong

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Temperature

Indicator

K -200 to 0 °C 0.14 °C Electrical

0 to 1370 °C 0.12 °C simulation using

multi-product

J -210 to 0 °C 0.12 °C calibrator based

0 to 1200 °C 0.10 °C on ITS-90 Table

T -200 to 0 °C 0.12 °C

0 to 400 °C 0.10 °C

-200 to 0 °C 0.10 °C

E

N

0 to 1300 °C 0.10 °C

-200 to 0 °C 0.16 °C

0 to 1300 °C 0.10 °C

B 250 to 600 °C 0.50 °C

600 to 1820 °C 0.15 °C

-50 to 0 °C 0.35 °C

R

0 to 1760 °C 0.14 °C

S -50 to 0 °C 0.33 °C

0 to 1760 °C 0.16 °C

Pt 100 -200 to 850 °C 0.065 °C

Page 17: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 16 of 30

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SCOPE OF CALIBRATION: TEMPERATURE

Signatories:

1. Ching Kar Chien 2. Chew Chii Tsong

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Temperature

Simulator

K -200 to 0 °C 0.19 °C Measurement

0 to 1370 °C 0.13 °C using multimeter

based on ITS-90

J -210 to 0 °C 0.16 °C Table

0 to 1200 °C 0.11 °C

T -200 to 0 °C 0.18 °C

0 to 400 °C 0.10 °C

E -200 to 0 °C 0.13 °C

0 to 1000 °C 0.10 °C

-200 to 0 °C 0.25 °C

N

0 to 1300 °C 0.11 °C

B 250 to 600 °C 0.93 °C

600 to 1820 °C 0.23 °C

-50 to 0 °C 0.64 °C

R

0 to 1760 °C 0.21 °C

S -50 to 0 °C 0.60 °C

0 to 1760 °C 0.24 °C

Pt 100 -200 to 850 °C 0.059 °C

Page 18: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 17 of 30

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SCOPE OF CALIBRATION: VOLUME

SITE: CATEGORY 1

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

pH Meter 4.01 pH 0.03 pH Standard Buffer 7.01 pH 0.03 pH Solutions

10.01 pH

0.04 pH

Conductivity Meter

84 µS/cm

1413 µS/cm

2 µS/cm

10 µS/cm

Calibrated NIST

Traceable Standard solution based on ASTM D 1125-14

Signatories:

1. Chew Siou Lian 2. Ching Kar Chien

SCOPE OF CALIBRATION: VOLUME

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

pH Meter 4.01 pH 0.03 pH Standard Buffer 7.01 pH 0.03 pH Solutions

10.01 pH

0.03 pH

Conductivity Meter

84 µS/cm

1413 µS/cm

2 µS/cm 9 µS/cm

Calibrated NIST

Traceable Standard solution based on ASTM D 1125-14

Refractometer / Sucrose Mass

Fraction / Refractive Index

0 % to 50 % Brix

(1.333 nD ~ 1.420 nD)

± 0.32 % Brix

Sucrose powder with analytical

balance

Signatories:

1. Chew Siou Lian 2. Ching Kar Chien

Page 19: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 18 of 30

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SCOPE OF CALIBRATION: VOLUME

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Volumetric 1 to 20 µl 0.040 µl

Apparatus Above 20 to 100 µl 0.10 µl Gravimetric

(To Deliver) Above 100 to 200 µl 0.15 µl Method based

Above 200 to 1000 µl 0.48 µl on ISO 8655-

Piston-Operated Above 1000 to 5000 µl 3.4 µl 6:2002

Pipette, Type A

One-Mark 1 to 10 ml 0.0066 ml

Pipette Above 10 to 100 ml 0.019 ml

Above 100 to 200 ml 0.029 ml

Above 200 to 500 ml 0.069 ml

Above 500 to 1000 ml 0.15 ml

Volumetric 1 to 10 ml 0.041 ml

Apparatus Above 10 to 100 ml 0.24 ml

(To Contain) Above 100 to 200 ml 0.35 ml

Above 200 to 500 ml 0.58 ml

Measuring Above 500 to 1000 ml 1.6 ml Cylinder Flask

Signatories:

1. Chew Siou Lian 2. Ching Kar Chien

Page 20: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 19 of 30

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SCOPE OF SCOPE OF CALIBRATION: ELECTRICAL SCOPE: CATEGORY I

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Measuring Instruments

DC Voltage

0 mV to 320 mV 0.32 V to 3.2 V 3.2 V to 32 V 32 V to 320 V

320 V to 1050 V

5.7 μV/V + 1.1 μV 8.1 μV/V + 6.4 μV 13 μV/V + 2.4 μV 12 μV/V + 33 μV

4.5 μV/V + 5.1 mV

Generation using

Calibrator model

Wavetek 9100

AC Voltage 0 V to 1050 V See Matrix A

DC Current

0 µA to 320 µA 0.32 mA to 3.2 mA 3.2 mA to 32 mA 32 mA to 320 mA

0.32 A to 3.2 A 3.2 A to 20 A

390 μA/A + 5.2 mA 5.9 μA/A + 0.13 mA 34 μA/A + 0.038 mA 33 μA/A + 0.0012 mA 0.29 mA/A + 0.11 mA 0.58 mA/A + 0.55 mA

AC Current 0 A to 20 A See Matrix B

Resistance 0 Ω to 40 Ω

40 Ω to 400 Ω 400 Ω to 4 kΩ 4 kΩ to 40 kΩ

40 kΩ to 400 kΩ 400 kΩ to 4 MΩ 4 MΩ to 40 MΩ

40 MΩ to 400 MΩ

0.055 mΩ/Ω + 0.18 mΩ 0.017 mΩ/Ω + 1.7 mΩ 0.013 mΩ/Ω + 3.9 mΩ 0.019 mΩ/Ω + 19 mΩ 0.035 mΩ/Ω + 1.3 Ω 0.11 mΩ/Ω + 26 Ω

0.020 mΩ/Ω + 0.43 kΩ 0.59 mΩ/Ω + 40 kΩ

Page 21: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 20 of 30

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SCOPE OF SCOPE OF CALIBRATION: ELECTRICAL SCOPE: CATEGORY I

Matrix A

AC Voltage Measurement

Range Frequency

Hz kHz

0 to 10 10 to 50 0.05 to 1 1 to 30 30 to 50 50 to 100

0 mV to 320 mV 0.0007 + 0.12

0.0027 + 0.084

0.00024 + 0.084

0.00028 + 0.21

0.00093 + 0.21

0.00028 + 0.47

320 mV to 3.2 V 0.34 + 0.006

0.24 + 0.0093

0.2 + 0.0092

0.66 + 0.00010

0.44 + 0.11 1.5 + 0.00010

3.2 V to 32 V 0.42 +0.56 0.33 + 0.55 0.33 + 0.54 0.54 + 1.2 0.62 + 2.7 1.6 + 4.0

32 V to 320 V 0.34 + 7.2 0.35 + 3.4 0.35 + 3.4 0.11 + 32

320 V to 1050 V 0.68 + 130 0.68 + 130 1.1 + 240

The expanded uncertainties given in above table are expressed in mV/V + mV

Matrix B

AC Current Measurement

Range Frequency (Hz )

Frequency ( kHz )

0 to 10 0.01 to 3 3 to 10 10 to 30

0 to 320 µA 0.11 mA/A + 285 mA

0.096 mA/A + 285 mA

0.068 mA/A + 285 mA

0.089 mA/A + 285 mA

320 µA to 3.2 mA 0.16 mA/A + 0.27 µA

0.27 mA/A + 0.23 µA

0.22 mA/A + 0.24 µA

0.22 mA/A + 0.25 µA

3.2 mA to 32 mA 0.28 mA/A + 0.32 μA

0.27 mA/A + 0.23 μA

0.27 mA/A + 0.21 μA

0.47 mA/A + 0.26 μA

32 mA to 320 mA 0.68 mA/A + 13 μA

0.67 mA/A +13 μA

0.68 mA/A + 13 μA

0.76mA/A + 9.2 μA

0.32 A to 3.2 A 0.50 mA/A + 0.30 mA

0.69 mA/A + 0.067 mA

0.69 mA/A + 0.067 mA

3.2 A to 20 A

- 0.35 mA/A - -

Signatories:

1. Kenny Ching Ah Hoo 2. Gabriel Ching Kar Ee 3. Ching Kar Chien

Page 22: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 21 of 30

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SCOPE OF SCOPE OF CALIBRATION: ELECTRICAL SCOPE: CATEGORY I

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Measuring

Instruments

Frequency 0.5 Hz to 320 Hz 29 ppm Generation using

320 Hz to 3.2 kHz 29 ppm Calibrator model

3.2 kHz to 32 kHz 29 ppm Wavetek 9100

32 kHz to 3.2 MHz 29 ppm

3.2 MHz to 10 MHz 29 ppm

Capacitance 0.5 nF to 4 nF 4.9 mF/F

4 nF to 40 nF 3.7 mF/F

40 nF to 400 nF 2.4 mF/F

400 nF to 4 µF 2.7 mF/F

4 µF to 40 µF 3.7 mF/F

40 µF to 400 µF 3.9 mF/F

400 µF to 4 mF 3.9 mF/F

4 mF to 40 mF 5.1 mF/F

Resistance 10 mΩ to 90 mΩ 8.7 mΩ/Ω Direct

100 mΩ to 900 mΩ 1.2 mΩ/Ω measurement

1 Ω to 9 Ω 0.24 mΩ/Ω with TIME

10 Ω to 90 Ω 0.17 mΩ/Ω Decade

100 Ω to 900 Ω 0.16 mΩ/Ω Resistance Box

1 kΩ to 9 kΩ 0.16 mΩ/Ω

10 kΩ to 90 kΩ 0.16 mΩ/Ω

100 kΩ to 900 kΩ 0.16 mΩ/Ω

1 MΩ to 9 MΩ 0.16 mΩ/Ω

10 MΩ to 90 MΩ 0.16 mΩ/Ω

100 MΩ to 199.99 MΩ

0.16 mΩ/Ω

Clamp Meter

DC Current (+/- polarities)

- 50 Turn Coil 1.6 to 16 A 0.37 mA/A Generating using

16 to 160 A 0.37 mA/A Calibrator model

160 to 525 A 0.12 mA/A Wavetek 9100

525 to 1000 A 0.58 mA/A with Current Coil

Page 23: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 22 of 30

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SCOPE OF SCOPE OF CALIBRATION: ELECTRICAL SCOPE: CATEGORY I

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Clamp Meter

AC Current - 50 Turn Coil

1.6 to 16 A 10 to 100 Hz

100 to 440 Hz

1.6 to 16 A 10 to 100 Hz

100 to 440 Hz

1.6 to 16 A 10 to 100 Hz

100 to 440 Hz

1.3 mA/A 3.2 mA/A

1.4 mA/A 3.4 mA/A

1.3 mA/A 3.2 mA/A

Generating using Calibrator model Wavetek 9100 with Current Coil

Generating Instruments

DC Voltage

0 to 100 mV 100 mV to 1 V

1 V to 10 V 10 V to 100 V

100 V to 1000 V

3.2 nV/V + 1.7 μV 7.7 μV/V + 0.85 μV 6.9 μV/V + 1.6 μV 4.8 μV/V + 21 μV 5.3 μV/V + 250 μV

Measurement Keysight 3458A

Digital Multimeter

AC Voltage 0 to 1000 V See Matrix C

DC Current

0 to 100 μA

100 μA to 1 mA 1 mA to 10 mA

10 mA to 100 mA 100 mA to 1 A

46 mA/A + 17 nA 7.5 μA /A + 14 nA 4.9 μA /A + 19 nA 5.6 μA/A + 12 nA

0.014 mA/A + 2.9 μA

1 A to 3 A

1.5 mA/A + 2.0 mA

Measurement Agilent 34401A Multimeter

AC Current

0 to 3 A

See Matrix D

Measurement

Keysight 3458A Digital Multimeter

Resistance 0 to 10 Ω 10 Ω to 100 Ω 100 Ω to 1 kΩ 1 kΩ to 10 kΩ

10 kΩ to 100 kΩ 100 kΩ to 1 MΩ 1 MΩ to 10 MΩ

10 MΩ to 100 MΩ

42 nΩ/Ω + 0.32 mΩ 15 μΩ/Ω + 0.18 mΩ 13 μΩ/Ω + 0.44 mΩ 4.7 μΩ/Ω + 20 mΩ 4.8 μΩ/Ω + 66 mΩ 3.7 μΩ/Ω + 1.3 Ω 26 μΩ/Ω + 79 Ω

130 μΩ/Ω + 38 kΩ

Frequency 1 Hz to 40 Hz 40 Hz to 100 Hz

100 Hz to 100 kHz 100 kHz to 10 MHz

570 ppm 120 ppm 120 ppm 130 ppm

Page 24: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 23 of 30

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SCOPE OF SCOPE OF CALIBRATION: ELECTRICAL SCOPE: CATEGORY I

Generating Instruments

AC Voltage:

Matrix C

Frequency

Voltage

Hz kHz

0 to 40 0.04 to 1 1 to 20 20 to 50 50 to 100

0 to 10 mV 2.9 mV/V 0.88 mV/V 0.55 mV/V 0.31 mV/V 1.1 mV/V + 19 μV + 3.7 μV + 7.4 μV + 15 μV + 15 μV

10 mV to 100 mV 4.7 mV/V 0.12 mV/V 0.11 mV/V 0.80 mV/V 0.71 mV/V + 73 μV + 12 μV + 12 μV + 9.6 μV + 18 μV

100 mV to 1 V 109 μV/V 114 μV/V 102 μV/V 184 μV/V 185 μV/V + 18 μV + 12 μV + 12 μV + 71 μV + 70 μV

1 V to 10 V 76 μV/V 77 μV/V 69 μV/V 188 μV/V 190 μV/V + 50 μV + 49 μV + 45 μV + 67 μV + 66 μV

10 V to 100 V 79 μV/V 80 μV/V 46 μV/V 180 μV/V 700 μV/V + 19 μV + 19 μV + 1.2 mV + 4.7 mV + 9.4 mV

100 V to 1000 V 68 μV/V 68 μV/V - - - + 1.2 mV + 1.2 mV

The expanded uncertainties given in above table are expressed in mV/V

AC Current:

Matrix D

Frequency

Voltage

Hz kHz Measuring

Instrument

0 to 50 0.05 to 1 1 to 5 5 to 30

0 A to 1 mA 0.26 mA/A 0.17 mA/A 0.21 mA/A 0.92 mA/A Keysight + 0.38 μA + 70 nA + 59 nA + 59 nA 3458A

1 mA to 10 mA 0.19 mA/A 0.23 mA/A 0.23 mA/A 0.15 mA/A Keysight + 0.45 μA + 9.9 nA + 45 nA + 0.84 nA 3458A

10 mA to 100 mA 0.21 mA/A 0.21 mA/A 0.21 mA/A 0.21 mA/A Keysight + 0.21 μA + 0.17 μA + 0.17 μA + 0.17 μA 3458A

100 mA to 1 A 4.7 mA/A 0.17 mA/A 1.2 mA/A - Keysight + 240 μA + 24 μA + 240 μA 3458A

1 A to 3 A 0.81 mA/A 0.81 mA/A 0.81 mA/A - Agilent

+ 0.15 mA + 0.15 mA + 0.15 mA 34401A The expanded uncertainties given in above table are expressed in mA/A

Signatories:

1. Gabriel Ching Kar Ee 2. Ching Kar Chien

Page 25: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 24 of 30

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SCOPE OF SCOPE OF CALIBRATION: ELECTRICAL

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Measuring

Instrument

DC Voltage

0 V to 320 mV 5.7 μV/V + 1.1 μV Generation using

0.32 V to 3.2 V 8.1 μV/V + 6.4 μV calibrator model

3.2 V to 32 V 13 μV/V + 2.4 μV Wavetek 9100

32 V to 320 V 12 μV/V + 33 μV

320 V to 1050 V

4.5 μV/V + 5.1 mV

AC Voltage 0 V to 1050 V See Matrix A

DC Current 0 A to 320 µA 390 μA/A + 5.2 mA

0.32 mA to 3.2 mA 5.9 μA/A + 0.13 mA

3.2 mA to 32 mA 34 μA/A + 0.038 mA

32 mA to 320 mA 33 μA/A + 0.0012 mA

0.32 A to 3.2 A 0.29 mA/A + 0.11 mA

3.2 A to 20 A

0.58 mA/A + 0.55 mA

AC Current 0 A to 20 A See Matrix B

Resistance 0 Ω to 40 Ω 0.055 mΩ/Ω + 0.18 mΩ

40 Ω to 400 Ω 0.017 mΩ/Ω + 1.7 mΩ

400 Ω to 4 kΩ 0.013 mΩ/Ω + 3.9 mΩ

4 kΩ to 40 kΩ 0.019 mΩ/Ω + 19 mΩ

40 kΩ to 400 kΩ 0.035 mΩ/Ω + 1.3 Ω

400 kΩ to 4 MΩ 0.11 mΩ/Ω + 26 Ω

4 MΩ to 40 MΩ 0.020 mΩ/Ω + 0.43 kΩ

40 MΩ to 400 MΩ

0.59 mΩ/Ω + 40 kΩ

Page 26: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 25 of 30

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Matrix A

AC Voltage Measurement

The expanded uncertainties given in above table are expressed in mV/V + mV

Matrix B

AC Current Measurement

Range Frequency Frequency

(Hz ) ( kHz )

0 to 10 0.01 to 3 3 to 10 10 to 30

0 to 320 µA 0.11 mA/A 0.096 mA/A 0.068 mA/A 0.089 mA/A

+ 285 mA + 285 mA + 285 mA + 285 mA

320 µA to 3.2 mA 0.16 mA/A 0.27 mA/A 0.22 mA/A 0.22 mA/A

+ 0.27 μA + 0.23 μA + 0.24 μA + 0.25 μA

3.2 mA to 32 mA 0.28 mA/A 0.27 mA/A 0.27 mA/A 0.47 mA/A

+ 0.32 μA + 0.23 μA + 0.21 μA + 0.26 μA

32 mA to 320 mA 0.68 mA/A 0.67 mA/A 0.68 mA/A 0.76 mA/A

+ 13 μA + 13 μA + 13 μA + 9.2 μA

0.32 A to 3.2 A 0.50 mA/A 0.69 mA/A 0.69 mA/A -

+ 0.30 mA + 0.067 mA + 0.067 mA

3.2 A to 20 A

- 0.35 mA/A

- -

Signatories:

1. Kenny Ching Ah Hoo 2. Gabriel Ching Kar Ee 3. Ching Kar Chien

Range Frequency

Hz kHz

0 to 10 10 to 50 0.05 to 1 1 to 30 30 to 50 50 to 100

0 mV to 320 mV 0.0007 + 0.12

0.0027 + 0.084

0.00024 + 0.084

0.00028 + 0.21

0.00093 + 0.21

0.00028 + 0.47

320 mV to 3.2 V 0.34 + 0.006

0.24 + 0.0093

0.2 + 0.0092

0.66 + 0.00010

0.44 + 0.11

1.5 + 0.00010

3.2 V to 32 V 0.42 +0.56 0.33 + 0.55 0.33 + 0.54 0.54 + 1.2 0.62 + 2.7 1.6 + 4.0

32 V to 320 V 0.34 + 7.2 0.35 + 3.4 0.35 + 3.4 0.11 + 32

320 V to 1050 V 0.68 + 130 0.68 + 130 1.1 + 240

Page 27: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 26 of 30

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SCOPE OF SCOPE OF CALIBRATION: ELECTRICAL

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Measuring

Instruments

Frequency 0.5 Hz to 320 Hz 320 Hz to 3.2 kHz 3.2 kHz to 32 kHz 32 kHz to 3.2 MHz 3.2 MHz to 10 MHz

29 ppm Generation

29 ppm using Calibrator

29 ppm model Wavetek

29 ppm 9100

29 ppm

Capacitance 0.5 to 4 nF 4.9 mF/F

4 nF to 40 nF 3.7 mF/F

40 nF to 400 nF 2.4 mF/F

400 nF to 4 µF 2.7 mF/F

4 µF to 40 µF 3.7 mF/F

40 µF to 400 µF 3.9 mF/F

400 µF to 4 mF 3.9 mF/F

4 mF to 40 mF 5.1 mF/F

Resistance 10 mΩ to 90 mΩ 100 mΩ to 900 mΩ

1 Ω to 9 Ω 10 Ω to 90 Ω

100 Ω to 900 Ω 1 kΩ to 9 kΩ

10 kΩ to 90 kΩ 100 kΩ to 900 kΩ

1 MΩ to 9 MΩ 10 MΩ to 90 MΩ

100 MΩ to 199.99 MΩ

8.7 mΩ/Ω 1.2 mΩ/Ω 0.24 mΩ/Ω 0.17 mΩ/Ω 0.16 mΩ/Ω 0.16 mΩ/Ω 0.16 mΩ/Ω 0.16 mΩ/Ω 0.16 mΩ/Ω 0.16 mΩ/Ω 0.16 mΩ/Ω

Direct

measurement with TIME Decade

Resistance Box

Clamp Meter

DC Current (+/- polarities)

- 50 Turn Coil 1.6 A to 16 A 0.37 mA/A Generating using

16 A to 160 A 0.37 mA/A Calibrator model

160 A to 525 A 0.12 mA/A Wavetek 9100

525 A to 1000 A 0.58 mA/A with Current Coil

Page 28: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 27 of 30

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SCOPE OF CALIBRATION: ELECTRICAL

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Clamp Meter

Generating using Calibrator model Wavetek 9100

with Current Coil

AC Current 1.6 A to 16 A

- 50 Turn Coil 10 Hz to 100 Hz 1.3 mA/A

100 Hz to 440 Hz 3.2 mA/A

16 A to 160A

10 Hz to 100 Hz 1.4 mA/A

100 Hz to 440 Hz 3.4 mA/A

160 A to 1000 A

10 Hz to 100 Hz 1.3 mA/A

100 Hz to 440 Hz

3.2 mA/A

Generating

Instruments

DC Voltage 0 mV to 100 mV 36 nV/V + 1.7 µV Measurement

100 mV to 1 V 7.7 µV/V + 0.85 µV using Keysight

1 V to 10 V 6.9 µV/V + 1.6 µV 3458A Digital

0 to 1 000 V See Ma trix C Multimeter

10 V to 100 V 4.8 µV/V + 21 µV

100 V to 1000 V

5.3 µV/V + 250 µV

AC Voltage 0 V to 1000 V See Matrix C

DC Current 0 µA to 100 µA 46 mA/A + 17 nA

100 µA to 1 mA 7.5 µA/A + 14 nA

1 mA to 10 mA 4.9 µA/A + 19 nA

10 mA to 100 mA 5.6 µA/A + 12 nA

100 mA to 1 A 0.014 mA/A + 2.9 µA

Measurement

1 A to 3 A 1.5 mA/A + 2.0 mA using Agilent

34401A Multimeter

AC Current 0 to 3 A See Matrix D

Measurement using Keysight 3458A Digital

Multimeter

Resistance 0 Ω to 10 Ω

10 Ω to 100 Ω

100 kΩ to 1 kΩ

1 kΩ to 10 kΩ

10 kΩ to 100 kΩ

100 kΩ to 1 MΩ 1 MΩ to 10 MΩ

10 MΩ to 100 MΩ

42 µΩ/Ω + 0.32 mΩ

15 µΩ/Ω + 0.18 mΩ

13 µΩ/Ω + 0.44 mΩ

4.7 µΩ/Ω + 20 mΩ

4.8 µΩ/Ω + 66 mΩ

3.7 µΩ/Ω + 1.3 Ω 26 µΩ/Ω + 79 Ω

130 µΩ/Ω + 38 kΩ

Page 29: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 28 of 30

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SCOPE OF CALIBRATION: ELECTRICAL

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Generating

Instruments

Frequency 1 Hz to 40 Hz 570 ppm Measuring using

40 Hz to 100 Hz 120 ppm SANWA CD

100 Hz to 100 kHz 120 ppm 800a Multimeter

100 kHz to 10 MHz 130 ppm

Capacitance 1 µF to 10 µF 40 µF/F + 150 nF

10 µF to 100 µF 1.2 mF/F + 0.12 µF

Page 30: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 29 of 30

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AC Voltage:

Matrix C

Frequency

Voltage

Hz kHz

0 to 40 0.04 to 1 1 to 20 20 to 50 50 to 100

0 to 10 mV 2.9 mV/V 0.88 mV/V 0.55 mV/V 0.31 mV/V 1.1 mV/V + 19 μV + 3.7 μV + 7.4 μV + 15 μV + 15 μV

10 mV to 100 mV 4.7 mV/V 0.12 mV/V 0.11 mV/V 0.80 mV/V 0.71 mV/V + 73 μV + 12 μV + 12 μV + 9.6 μV + 18 μV

100 mV to 1 V 109 μV/V 114 μV/V 102 μV/V 184 μV/V 185 μV/V + 18 μV + 12 μV + 12 μV + 71 μV + 70 μV

1 V to 10 V 76 μV/V 77 μV/V 69 μV/V 188 μV/V 190 μV/V + 50 μV + 49 μV + 45 μV + 67 μV + 66 μV

10 V to 100 V 79 μV/V 80 μV/V 46 μV/V 180 μV/V 700 μV/V + 19 μV + 19 μV + 1.2 mV + 4.7 mV + 9.4 mV

100 V to 1000 V 68 μV/V 68 μV/V - - - + 1.2 mV + 1.2 mV

AC Current:

Matrix D

Frequency

Voltage

Hz kHz Measuring

Instrument

0 to 50 0.05 to 1 1 to 5 5 to 30

0 A to 1 mA 0.26 mA/A 0.17 mA/A 0.21 mA/A 0.92 mA/A Keysight + 0.38 μA + 70 nA + 59 nA + 59 nA 3458A

1 mA to 10 mA 0.19 mA/A 0.23 mA/A 0.23 mA/A 0.15 mA/A Keysight + 0.45 μA + 9.9 nA + 45 nA + 0.84 nA 3458A

10 mA to 100 mA 0.21 mA/A 0.21 mA/A 0.21 mA/A 0.21 mA/A Keysight + 0.21 μA + 0.17 μA + 0.17 μA + 0.17 μA 3458A

100 mA to 1 A 4.7 mA/A 0.17 mA/A 1.2 mA/A - Keysight + 240 μA + 24 μA + 240 μA 3458A

1 A to 3 A 0.81 mA/A 0.81 mA/A 0.81 mA/A - Agilent

+ 0.15 mA + 0.15 mA + 0.15 mA 34401A

Signatories:

1. Gabriel Ching Kar Ee 2. Ching Kar Chien

Page 31: Schedule - Metcal Technologies (M) Sdn. Bhd. · 2020. 4. 25. · JIS B 7184:1999 Measuring Scope X, Y-axis: 2 µm Comparison with (Measuring Accuracy 0 to 300 mm standard scale based

Schedule

SKIM AKREDITASI MAKMAL MALAYSIA (SAMM) LABORATORY ACCREDITATION SCHEME OF MALAYSIA

MS ISO/IEC 17025

Issue date: 22 February 2019 Valid until: 15 October 2020

NO: SAMM 256 (Issue 3, 22 February 2019 replacement of SAMM 256 dated 2 November 2017)

Page: 30 of 30

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SCOPE OF CALIBRATION: TIME AND FREQUENCY SITE: CATEGORY I

Instrument Calibrated/

Measurement Parameter

Range

Calibration and Measurement Capability

Expressed as an Uncertainty(±)*

Remarks

Stopwatch and Timer

0 to 9 hours 0.35 sec

Time measurement according to NIST

stopwatch and timer calibration

Tachometer

(rpm measuring devices)

(Non-contact) 0 to 599 rpm

600 to 30,000 rpm

25 ppm

3.6 ppm + 0.013 rpm

Frequency Generator with Agilent 34401A

Multimeter

(Contact) 0 to 5,000 rpm

1.6 rpm

Comparison with

Reference Tachometer

Signatories:

1. Gabriel Ching Kar Ee 2. Ching Kar Chien 3. Chew Chii Tsong

SCOPE OF CALIBRATION: TIME AND FREQUENCY

Instrument Calibrated/

Measurement Parameter

Range Calibration and Measurement Capability Expressed as an

Uncertainty(±)* Remarks

Stopwatch and Timer

0 to 9 hours 0.11 sec Time measurement according to NIST

stopwatch and timer calibration

Tachometer (rpm measuring

devices)

(Non-contact) 0 to 599 rpm

600 to 99,999 rpm

25 ppm 12 ppm + 0.005 rpm

Frequency Generator with Universal Counter

HP 5335A

(Contact) 0 to 5,000 rpm

1.6 rpm

Comparison with Reference Tachometer

Signatories:

1. Gabriel Ching Kar Ee 2. Ching Kar Chien 3. Chew Chii Tsong