How Ίο Solve Polymer Surface Problems Application # 1 — Surface Modification

^ complementary

bJ«tic SMS analysis (Fizurr 3l°f ^e treated surfaœ shows that the oxyL containing sites art aliphatic.

When you modify a polymer, you change the surface characteristics. But how do you characterize the polymer after it's been modified — especially when the surface is only a few atoms thick?

Accurate identification of the complex changes in the top atomic layers of a polymer requires a detailed chemical composition analysis. The kind of detail only available using multiple surface analysis techniques.

X-ray Photoelectron Spectroscopy (XPS) and Static Secondary Ion Mass Spectrometry (SIMS) can tell you what you need to know. Together, these techniques provide:

• Quantifiable short range chemistry • Mass fragment pattern information • Molecular fingerprint identification.

Combining XPS and Static SIMS is not only the best way to solve polymer surface modification problems. . . in many cases, it's the only way.

You ' re a phone call away from a solution!

Using the Perkm-Elmer (PHI) 5500 MultiTechnique surface analysis system, our laboratory scientists have worked directly with polymer chemists to solve a wide range of problems, including contamination, surface modification, biocompatibility and adhesion.

If you want to know more about how XPS and Static SIMS surface analysis can help you understand your polymer applications, talk to one of our lab scientists today. Our number is (612) 828-6367.

We'll also send you a free package that includes our latest polymer Application Notes, Technical Bulletins and articles. Or, if you prefer, fax us your request at (612) 828-6322.

PHI Provides Polymer Solutions

Perkin-Elmer, Physical Electronics Division 6509 Flying Cloud Drive, Eden Prairie, MN 55344

PERKIN ELMER CIRCLE 115 ON READER SERVICE CARD

ftruVte »

r. i »

cvv

stf

v.QOte ^

sN1

Ο w ο -

çx~ c=o

jg^Q

ctf*

c^ s

figure 3 C,Hxo-

fyv C3HxO *

99A

08Z 75

Mass/Charge (m/e) 150

- ~J^^<{*$^